IN THIS ISSUE Rietveld Refinement from Powder Diffraction Data
نویسندگان
چکیده
CPD chairman’s message, Paolo Scardi 2 CPD projects: 2 Quantitative Phase Analysis RR, Ian Madsen Editor’s message, Robert Dinnebier 2 Thirty five years ago, Hugo Rietveld 3 WWW sites related to Powder Diffraction 5 IUCr Commission on Powder Diffraction 5 Rietveld Refinement from Powder Diffraction Data Beyond the abilities of Rietveld analysis: MEM-based pattern fitting with synchrotron X-ray powder diffraction data 7 Fujio Izumi and Takuji Ikeda Anisotropic Peak Broadening in High Resolution Data on RbC60 9 Peter W. Stephens and Ashfia Huq Recent developments of the program FULLPROF 12 Juan Rodríguez-Carvajal Rietveld Refinement and Beyond 20 David E. Cox Accuracy In X-ray Powder Diffraction: A Comparison of Quantitative Methods 21 Nicola V.Y. Scarlett and Ian C. Madsen Internet Available Rietveld Software 24 Lachlan M. D. Cranswick Dealing with unknown impurity phases 30 W.I.F. David Rietveld refinements with JANA2000 32 Michal Dušek, Václav Petricek, Markus Wunschel, Robert E. Dinnebier and Sander van Smaalen
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Global Rietveld Refinement
Global optimisation methods of structure determination from powder diffraction data have risen to prominence in a relatively short space of time and they now constitute a key approach in the examination of polycrystalline molecular organic materials. A correctly formulated global optimisation approach may be regarded as a "global Rietveld refinement" that is capable of delivering accurate cryst...
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